Electron microscopy and sample preparation facilities
Electron microscopy
TEM JEOLJEM 2100 UHR with EDX and STEM unit
SEM JEOLJSM 7100F TTLS (FEG) with EDX and CL spectroscopy
Sample preparation facilities
Precision etching coating system Gatan, Model 682
Cross section polisher JEOL IB-09010CP
Optical microscope with camera
Precision ion polishing system Gatan PIPS II, Model 695
Diamond saw