Electron microscopy and sample preparation facilities
Electron microscopy
![TEM](/media/images/TEM.width-800.jpg)
TEM JEOLJEM 2100 UHR with EDX and STEM unit
![SEM](/media/images/SEM.width-800.jpg)
SEM JEOLJSM 7100F TTLS (FEG) with EDX and CL spectroscopy
Sample preparation facilities
![2_Sputtering](/media/images/2_Sputtering.width-800.jpg)
Precision etching coating system Gatan, Model 682
![2_ion_polishing](/media/images/2_ion_polishing.width-800.jpg)
Cross section polisher JEOL IB-09010CP
![2_optical_microscope](/media/images/2_optical_microscope.width-800.jpg)
Optical microscope with camera
![2_ion_polishing_2](/media/images/2_ion_polishing_2.width-800.jpg)
Precision ion polishing system Gatan PIPS II, Model 695
![2_diamond_saw](/media/images/2_diamond_saw.width-800.jpg)
Diamond saw